| 11152214 |
Structures and methods for equivalent oxide thickness scaling on silicon germanium channel or III-V channel of semiconductor device |
Takashi Ando, John Bruley, Martin M. Frank, Vijay Narayanan, John Rozen |
2021-10-19 |
| 11121209 |
Surface area enhancement for stacked metal-insulator-metal (MIM) capacitor |
Takashi Ando, Hemanth Jagannathan, Paul C. Jamison, Vijay Narayanan |
2021-09-14 |
| 11038013 |
Back-end-of-line compatible metal-insulator-metal on-chip decoupling capacitor |
Paul C. Jamison, Takashi Ando, John G. Massey |
2021-06-15 |
| 10997321 |
Encryption engine with an undetectable/tamper proof private key in late node CMOS technology |
Richard H. Boivie, Daniel J. Friedman, Kohji Hosokawa, Charanjit Singh Jutla, Wanki Kim +10 more |
2021-05-04 |
| 10991881 |
Method for controlling the forming voltage in resistive random access memory devices |
Steven P. Consiglio, Cory Wajda, Kandabara Tapily, Takaaki Tsunomura, Takashi Ando +3 more |
2021-04-27 |
| 10978551 |
Surface area enhancement for stacked metal-insulator-metal (MIM) capacitor |
Takashi Ando, Hemanth Jagannathan, Paul C. Jamison, Vijay Narayanan |
2021-04-13 |
| 10886362 |
Multilayer dielectric for metal-insulator-metal capacitor (MIMCAP) capacitance and leakage improvement |
Takashi Ando, Hemanth Jagannathan, Paul C. Jamison |
2021-01-05 |
