Franciscus Godefridus Casper Bijnen

Issued Patents 2021

Showing 1–7 of 7 patents

Patent #	Title	Co-Inventors	Date
11181836	Method for determining deformation	Edo Maria Hulsebos, Patricius Aloysius Jacobus Tinnemans	2021-11-23
11105619	Measurement apparatus	Junichi KANEHARA, Stefan Carolus Jacobus Antonius Keij, Thomas Augustus Mattaar, Petrus Franciscus Van Gils	2021-08-31
11079684	Measurement apparatus and a method for determining a substrate grid	Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Robert John Socha, Youping Zhang	2021-08-03
11054813	Method and apparatus for controlling an industrial process using product grouping	Alexander Ypma, David Deckers, Richard Johannes Franciscus Van Haren, Weitian Kou	2021-07-06
11029610	Lithographic method	Patricius Aloysius Jacobus Tinnemans, Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Ahmet Koray Erdamar, Loek Johannes Petrus Verhees +11 more	2021-06-08
10962887	Lithographic method	Patricius Aloysius Jacobus Tinnemans, Edo Maria Hulsebos, Henricus Johannes Lambertus Megens, Sudharshanan Raghunathan, Boris Menchtchikov +13 more	2021-03-30
10901326	Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatus	Edo Maria Hulsebos, Patricius Aloysius Jacobus Tinnemans, Ralph Brinkhof, Pieter Jacob Heres, Jorn Kjeld Lucas +2 more	2021-01-26