Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10817999 | Image-based overlay metrology and monitoring using through-focus imaging | David Gready, Claire E. Staniunas | 2020-10-27 |
| 10565697 | Utilizing overlay misregistration error estimations in imaging overlay metrology | Tzahi Grunzweig, Nadav Gutman, David Gready, Mark Ghinovker, Vladimir Levinski +2 more | 2020-02-18 |