Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10571811 | Device metrology targets and methods | Eran Amit, Daniel Kandel, Dror Alumot, Liran Yerushalmi | 2020-02-25 |
| 10551749 | Metrology targets with supplementary structures in an intermediate layer | Vladimir Levinski, Amnon Manassen, Eran Amit, Nuriel Amir, Liran Yerushalmi | 2020-02-04 |