Issued Patents 2020
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10825649 | Electron beam device | Daisuke Bizen, Makoto Sakakibara | 2020-11-03 |
| 10692693 | System and method for measuring patterns | Wei Sun, Taku Ninomiya, Yasunori Goto | 2020-06-23 |
| 10636618 | Charged particle beam apparatus | Kaori Bizen, Makoto Sakakibara, Hiroya Ohta, Kenji Tanimoto, Yusuke Abe | 2020-04-28 |
| 10629405 | Electron beam device and sample inspection method | Momoyo Enyama, Megumi Kimura, Koichi Hamada | 2020-04-21 |
| 10559450 | Scanning electron microscope | Noritsugu Takahashi, Akira Ikegami, Yuta Kawamoto | 2020-02-11 |