Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10707047 | Measuring device and measuring method | Makoto Sakakibara, Wataru MORI, Hajime Kawano, Yuko Sasaki | 2020-07-07 |
| 10559450 | Scanning electron microscope | Yasunari Sohda, Akira Ikegami, Yuta Kawamoto | 2020-02-11 |