Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10770266 | Charged particle beam device and capturing condition adjusting method in charged particle beam device | Tomohito Nakano, Toshiyuki Yokosuka, Minoru Yamazaki, Yuzuru Mochizuki | 2020-09-08 |
| 10707047 | Measuring device and measuring method | Noritsugu Takahashi, Makoto Sakakibara, Wataru MORI, Hajime Kawano | 2020-07-07 |
| 10692687 | Measurement and inspection device | Wen Li, Shinichi Murakami, Hiroyuki Takahashi, Minoru Yamazaki, Hajime Kawano | 2020-06-23 |
| 10566172 | Charged particle beam apparatus and method for adjusting imaging conditions for the same | Tomohito Nakano, Toshiyuki Yokosuka, Minoru Yamazaki, Yuzuru Mochizuki | 2020-02-18 |