Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10847344 | Charged particle beam control device | Wen Li, Hiroyuki Takahashi, Masazumi Tone | 2020-11-24 |
| 10692687 | Measurement and inspection device | Wen Li, Hiroyuki Takahashi, Yuko Sasaki, Minoru Yamazaki, Hajime Kawano | 2020-06-23 |