Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10770266 | Charged particle beam device and capturing condition adjusting method in charged particle beam device | Tomohito Nakano, Toshiyuki Yokosuka, Yuko Sasaki, Yuzuru Mochizuki | 2020-09-08 |
| 10692687 | Measurement and inspection device | Wen Li, Shinichi Murakami, Hiroyuki Takahashi, Yuko Sasaki, Hajime Kawano | 2020-06-23 |
| 10566172 | Charged particle beam apparatus and method for adjusting imaging conditions for the same | Tomohito Nakano, Toshiyuki Yokosuka, Yuko Sasaki, Yuzuru Mochizuki | 2020-02-18 |
| 10546715 | Charged particle beam device | Shahedul Hoque, Hajime Kawano, Yoshinori Momonoi, Hideki ITAI, Hiroshi Nishihama | 2020-01-28 |