Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10818470 | Charged particle beam device | Kazuki Ikeda, Wen Li, Takuma Nishimoto, Hiroyuki Takahashi, Makoto Suzuki +1 more | 2020-10-27 |
| 10796880 | Charged particle beam device and charged particle beam device noise source determination method | Takuma Nishimoto, Wen Li, Hiroyuki Takahashi, Hajime Kawano | 2020-10-06 |
| 10707047 | Measuring device and measuring method | Noritsugu Takahashi, Makoto Sakakibara, Hajime Kawano, Yuko Sasaki | 2020-07-07 |