Issued Patents 2020
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10629405 | Electron beam device and sample inspection method | Yasunari Sohda, Momoyo Enyama, Koichi Hamada | 2020-04-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10629405 | Electron beam device and sample inspection method | Yasunari Sohda, Momoyo Enyama, Koichi Hamada | 2020-04-21 |