Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10720307 | Electron microscope device and inclined hole measurement method using same | Yuji Takagi, Fumihiko Fukunaga | 2020-07-21 |
| 10692693 | System and method for measuring patterns | Wei Sun, Yasunari Sohda, Taku Ninomiya | 2020-06-23 |