Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10810733 | Defect classification apparatus and defect classification method | Naoaki KONDO, Minoru Harada, Yuji Takagi | 2020-10-20 |
| 10770260 | Defect observation device | Yuko Otani, Yohei Minekawa, Takashi Nobuhara, Nobuhiko KANZAKI, Miyuki Fukuda +3 more | 2020-09-08 |
| 10559074 | Sample observation device and sample observation method | Minoru Harada, Yuji Takagi, Naoaki KONDO | 2020-02-11 |