Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10770260 | Defect observation device | Yohei Minekawa, Takashi Nobuhara, Nobuhiko KANZAKI, Takehiro Hirai, Miyuki Fukuda +3 more | 2020-09-08 |
| 10642164 | Defect detection device and defect observation device | Kazuo Aoki, Toshifumi Honda, Nobuhiko KANZAKI | 2020-05-05 |
| 10593062 | Defect observation apparatus | Kazuo Aoki, Yohei Minekawa | 2020-03-17 |