Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10770260 | Defect observation device | Yuko Otani, Takashi Nobuhara, Nobuhiko KANZAKI, Takehiro Hirai, Miyuki Fukuda +3 more | 2020-09-08 |
| 10593062 | Defect observation apparatus | Yuko Otani, Kazuo Aoki | 2020-03-17 |