Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861145 | Defect inspection device and defect inspection method | Takahiro Urano, Hisashi Hatano, Hironori Sakurai | 2020-12-08 |
| 10830706 | Defect inspection apparatus and defect inspection method | Shunichi Matsumoto, Masami Makuuchi, Yuta Urano, Keiko Oka | 2020-11-10 |
| 10816484 | Flaw inspection device and flaw inspection method | Takahiro Urano, Mamoru Kobayashi, Hisashi Hatano, Hironori Sakurai | 2020-10-27 |
| 10642164 | Defect detection device and defect observation device | Yuko Otani, Kazuo Aoki, Nobuhiko KANZAKI | 2020-05-05 |