Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10861145 | Defect inspection device and defect inspection method | Toshifumi Honda, Hisashi Hatano, Hironori Sakurai | 2020-12-08 |
| 10816484 | Flaw inspection device and flaw inspection method | Toshifumi Honda, Mamoru Kobayashi, Hisashi Hatano, Hironori Sakurai | 2020-10-27 |