Issued Patents 2020
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10830706 | Defect inspection apparatus and defect inspection method | Toshifumi Honda, Shunichi Matsumoto, Masami Makuuchi, Keiko Oka | 2020-11-10 |
| 10823686 | X-ray inspection method and X-ray inspection device | Kaifeng Zhang, Yoshiki Matoba, Akihiro Takeda | 2020-11-03 |
| 10663844 | Projection control apparatus and control method thereof, and projection system | Kensuke Inagaki, Makiko Mori | 2020-05-26 |