Issued Patents 2020
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10847355 | Mass analysis apparatus and method | Masahiro Sakuta, Shin Okawa | 2020-11-24 |
| 10823686 | X-ray inspection method and X-ray inspection device | Yuta Urano, Kaifeng Zhang, Akihiro Takeda | 2020-11-03 |
| 10651018 | Apparatus for and method of mass analysis | Masahiro Sakuta | 2020-05-12 |
| 10636638 | Mass analysis apparatus and method | Masahiro Sakuta, Shin Okawa | 2020-04-28 |