Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10877065 | Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method | Shinichi Taniguchi | 2020-12-29 |
| 10823686 | X-ray inspection method and X-ray inspection device | Yuta Urano, Yoshiki Matoba, Akihiro Takeda | 2020-11-03 |