Issued Patents 2020
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10810733 | Defect classification apparatus and defect classification method | Takehiro Hirai, Minoru Harada, Yuji Takagi | 2020-10-20 |
| 10559074 | Sample observation device and sample observation method | Minoru Harada, Yuji Takagi, Takehiro Hirai | 2020-02-11 |