Issued Patents 2019
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10509073 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Mark Kassab, Chen Wang | 2019-12-17 |
| 10509072 | Test application time reduction using capture-per-cycle test points | Sylwester Milewski, Nilanjan Mukherjee, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada | 2019-12-17 |
| 10473721 | Data streaming for testing identical circuit blocks | Jean-Francois Cote, Mark Kassab | 2019-11-12 |
| 10476740 | Data generation for streaming networks in circuits | Jean-Francois Cote, Mark Kassab | 2019-11-12 |
| 10444282 | Test point insertion for low test pattern counts | Elham K. Moghaddam, Nilanjan Mukherjee, Jerzy Tyszer, Justyna Zawada | 2019-10-15 |
| 10379161 | Scan chain stitching for test-per-clock | Jedrzej Solecki, Jerzy Tyszer, Grzegorz Mrugalski | 2019-08-13 |
| 10361873 | Test point-enhanced hardware security | Nilanjan Mukherjee, Elham K. Moghaddam, Jerzy Tyszer, Justyna Zawada | 2019-07-23 |
| 10234506 | Continuous application and decompression of test patterns and selective compaction of test responses | Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee | 2019-03-19 |
| 10222420 | Transition test generation for detecting cell internal defects | Xijiang Lin, Wu-Tung Cheng | 2019-03-05 |