Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10509072 | Test application time reduction using capture-per-cycle test points | Janusz Rajski, Sylwester Milewski, Nilanjan Mukherjee, Jerzy Tyszer, Justyna Zawada | 2019-12-17 |
| 10379161 | Scan chain stitching for test-per-clock | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski | 2019-08-13 |