Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10509072 | Test application time reduction using capture-per-cycle test points | Janusz Rajski, Sylwester Milewski, Nilanjan Mukherjee, Jedrzej Solecki, Justyna Zawada | 2019-12-17 |
| 10444282 | Test point insertion for low test pattern counts | Janusz Rajski, Elham K. Moghaddam, Nilanjan Mukherjee, Justyna Zawada | 2019-10-15 |
| 10379161 | Scan chain stitching for test-per-clock | Janusz Rajski, Jedrzej Solecki, Grzegorz Mrugalski | 2019-08-13 |
| 10361873 | Test point-enhanced hardware security | Janusz Rajski, Nilanjan Mukherjee, Elham K. Moghaddam, Justyna Zawada | 2019-07-23 |
| 10234506 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rajski, Mark Kassab, Nilanjan Mukherjee | 2019-03-19 |