Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10509072 | Test application time reduction using capture-per-cycle test points | Janusz Rajski, Sylwester Milewski, Nilanjan Mukherjee, Jedrzej Solecki, Jerzy Tyszer | 2019-12-17 |
| 10444282 | Test point insertion for low test pattern counts | Janusz Rajski, Elham K. Moghaddam, Nilanjan Mukherjee, Jerzy Tyszer | 2019-10-15 |
| 10361873 | Test point-enhanced hardware security | Janusz Rajski, Nilanjan Mukherjee, Elham K. Moghaddam, Jerzy Tyszer | 2019-07-23 |