Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444282 | Test point insertion for low test pattern counts | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Justyna Zawada | 2019-10-15 |
| 10361873 | Test point-enhanced hardware security | Janusz Rajski, Nilanjan Mukherjee, Jerzy Tyszer, Justyna Zawada | 2019-07-23 |