Issued Patents 2019
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10496779 | Generating root cause candidates for yield analysis | Robert Brady Benware, Christopher W. Schuermyer, Jonathan James Muirhead, Chen-Yi Chang | 2019-12-03 |
| 10372855 | Scan cell selection for partial scan designs | Xijiang Lin, Ting-Pu Tai, Takeo Kobayashi | 2019-08-06 |
| 10317462 | Wide-range clock signal generation for speed grading of logic cores | Shi-Yu Huang, Kun-Han Tsai, Tzu-Heng Huang | 2019-06-11 |
| 10234502 | Circuit defect diagnosis based on sink cell fault models | Huaxing Tang, Manish Sharma, Robert Brady Benware | 2019-03-19 |
| 10222420 | Transition test generation for detecting cell internal defects | Xijiang Lin, Janusz Rajski | 2019-03-05 |