Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10496779 | Generating root cause candidates for yield analysis | Wu-Tung Cheng, Christopher W. Schuermyer, Jonathan James Muirhead, Chen-Yi Chang | 2019-12-03 |
| 10234502 | Circuit defect diagnosis based on sink cell fault models | Huaxing Tang, Manish Sharma, Wu-Tung Cheng | 2019-03-19 |
| 10198548 | Identifying the defective layer of a yield excursion through the statistical analysis of scan diagnosis results | Manish Sharma | 2019-02-05 |