Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10324046 | Methods and systems for monitoring a non-defect related characteristic of a patterned wafer | Tao-Yi Fu, Steve R. Lange, Lisheng Gao, Xuguang Jiang, Sylvain Muckenhirn | 2019-06-18 |
| 10181185 | Image based specimen process control | Allen Park, Lisheng Gao, Ashok Kulkarni, Saibal Banerjee, Songnian Rong +1 more | 2019-01-15 |