Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10444161 | Systems and methods for metrology with layer-specific illumination spectra | Amnon Manassen, Andrew V. Hill, Ohad Bachar, Vladimir Levinski, Yuri Paskover | 2019-10-15 |
| 10190979 | Metrology imaging targets having reflection-symmetric pairs of reflection-asymmetric structures | Amnon Manassen, Yuri Paskover, Barry Loevsky | 2019-01-29 |