Issued Patents 2019
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10469782 | Power-conserving clocking for scanning sensors | — | 2019-11-05 |
| 10466212 | Scanning electron microscope and methods of inspecting and reviewing samples | Yung-Ho Alex Chuang, John Fielden, Marcel Trimpl, Jingjing Zhang, Devis Contarato +1 more | 2019-11-05 |
| 10462391 | Dark-field inspection using a low-noise sensor | Yung-Ho Alex Chuang, Devis Contarato, John Fielden, Daniel Kavaldjiev, Guoheng Zhao +4 more | 2019-10-29 |
| 10446696 | Back-illuminated sensor with boron layer | Jehn-Huar Chern, Ali R. Ehsani, Gildardo Delgado, Yung-Ho Alex Chuang, John Fielden | 2019-10-15 |
| 10429321 | Apparatus for high-speed imaging sensor data transfer | Steve Zamek, Venkatraman Iyer | 2019-10-01 |
| 10313622 | Dual-column-parallel CCD sensor and inspection systems using a sensor | Yung-Ho Alex Chuang, Jingjing Zhang, Sharon Zamek, John Fielden, Devis Contarato | 2019-06-04 |
| 10269842 | Anti-reflection layer for back-illuminated sensor | Masaharu Muramatsu, Hisanori Suzuki, Yasuhito Yoneta, Shinya Otsuka, Jehn-Huar Chern +3 more | 2019-04-23 |
| 10197501 | Electron-bombarded charge-coupled device and inspection systems using EBCCD detectors | Yung-Ho Alex Chuang, Xuefeng Liu, John Fielden | 2019-02-05 |
| 10193293 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, J. Joseph Armstrong, Justin Dianhuan Liou, Vladimir Dribinski | 2019-01-29 |
| 10194108 | Sensor with electrically controllable aperture for inspection and metrology systems | Yung-Ho Alex Chuang, John Fielden, Jingjing Zhang, Keith Lyon, Mark Wang | 2019-01-29 |