Issued Patents 2019
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466212 | Scanning electron microscope and methods of inspecting and reviewing samples | David L. Brown, Yung-Ho Alex Chuang, John Fielden, Jingjing Zhang, Devis Contarato +1 more | 2019-11-05 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466212 | Scanning electron microscope and methods of inspecting and reviewing samples | David L. Brown, Yung-Ho Alex Chuang, John Fielden, Jingjing Zhang, Devis Contarato +1 more | 2019-11-05 |