Issued Patents 2019
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10466212 | Scanning electron microscope and methods of inspecting and reviewing samples | David L. Brown, Yung-Ho Alex Chuang, John Fielden, Marcel Trimpl, Jingjing Zhang +1 more | 2019-11-05 |
| 10429321 | Apparatus for high-speed imaging sensor data transfer | Steve Zamek, David L. Brown | 2019-10-01 |
| 10269842 | Anti-reflection layer for back-illuminated sensor | Masaharu Muramatsu, Hisanori Suzuki, Yasuhito Yoneta, Shinya Otsuka, Jehn-Huar Chern +3 more | 2019-04-23 |