Issued Patents 2019
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10488348 | Wafer inspection | Anatoly Romanovsky, Ivan Maleev, Yury Yuditsky, Dirk Woll, Stephen Biellak +2 more | 2019-11-26 |
| 10462391 | Dark-field inspection using a low-noise sensor | Yung-Ho Alex Chuang, David L. Brown, Devis Contarato, John Fielden, Guoheng Zhao +4 more | 2019-10-29 |