Issued Patents 2019
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10488348 | Wafer inspection | Ivan Maleev, Daniel Kavaldjiev, Yury Yuditsky, Dirk Woll, Stephen Biellak +2 more | 2019-11-26 |
| 10324045 | Surface defect inspection with large particle monitoring and laser power control | Steve (Yifeng) Cui, Chunsheng Huang, Chunhai Wang, Christian Wolters, Bret Whiteside +2 more | 2019-06-18 |
| 10241217 | System and method for reducing radiation-induced false counts in an inspection system | Ximan Jiang, Christian Wolters, Stephen Biellak, Mous Tatarkhanov | 2019-03-26 |
| 10215712 | Method and apparatus for producing and measuring dynamically focused, steered, and shaped oblique laser illumination for spinning wafer inspection system | Christian Wolters, Bret Whiteside | 2019-02-26 |