Kaustuve Bhattacharyya

Issued Patents 2019

Showing 1–6 of 6 patents

Patent #	Title	Co-Inventors	Date
10481499	Determination of stack difference and correction using stack difference	Arie Jeffrey Den Boef	2019-11-19
10451978	Metrology parameter determination and metrology recipe selection	Simon Gijsbert Josephus Mathijssen, Marc Johannes Noot, Arie Jeffrey Den Boef, Mohammadreza Hajiahmadi, Farzad Farhadzadeh	2019-10-22
10394137	Inspection method, lithographic apparatus, mask and substrate	Youri Johannes Laurentius Maria Van Dommelen, Peter David Engblom, Lambertus Gerardus Maria Kessels, Arie Jeffrey Den Boef, Paul Christiaan Hinnen +1 more	2019-08-27
10386176	Metrology method, target and substrate	Henricus Wilhelmus Maria Van Buel, Christophe David Fouquet, Hendrik Jan Hidde Smilde, Maurits Van Der Schaar, Arie Jeffrey Den Boef +7 more	2019-08-20
10345709	Determination of stack difference and correction using stack difference	Arie Jeffrey Den Boef	2019-07-09
10338484	Recipe selection based on inter-recipe consistency	Arie Jeffrey Den Boef, Timothy Dugan Davis, Peter David Engblom	2019-07-02