BL

Baozhen Li

IBM: 8 patents #595 of 10,623Top 6%
Globalfoundries: 4 patents #92 of 961Top 10%
Overall (2018): #4,786 of 503,207Top 1%
12
Patents 2018

Issued Patents 2018

Patent #TitleCo-InventorsDate
10103060 Test structures for dielectric reliability evaluations David G. Brochu, JR., Roger A. Dufresne, Barry P. Linder, James H. Stathis, Ernest Y. Wu 2018-10-16
10090240 Interconnect structure with capacitor element and related methods Chih-Chao Yang, Keith Kwong Hon Wong 2018-10-02
10089161 System and method for managing semiconductor manufacturing defects Jeanne P. Bickford, Nazmul Habib, Pascal A. Nsame 2018-10-02
10083862 Protective liner between a gate dielectric and a gate contact Lawrence A. Clevenger, Kirk D. Peterson, Junli Wang 2018-09-25
10062647 Interconnect structure having tungsten contact copper wiring Anthony K. Stamper 2018-08-28
10020256 Electronic fuse having an insulation layer Chad M. Burke, Keith Kwong Hon Wong, Chih-Chao Yang 2018-07-10
10014255 Contacts having a geometry to reduce resistance Lawrence A. Clevenger, Kirk D. Peterson, Terry A. Spooner, Junli Wang 2018-07-03
9997408 Method of optimizing wire RC for device performance and reliability Lawrence A. Clevenger, Kirk D. Peterson, John E. Sheets, II, Terry A. Spooner 2018-06-12
9966308 Semiconductor device and method of forming the semiconductor device Lawrence A. Clevenger, Kirk D. Peterson, John E. Sheets, II, Junli Wang, Chih-Chao Yang 2018-05-08
9940430 Burn-in power performance optimization Jeanne P. Bickford, Nazmul Habib, Tad J. Wilder 2018-04-10
9891275 Integrated circuit chip reliability qualification using a sample-specific expected fail rate Jeanne P. Bickford, Nazmul Habib, Tad J. Wilder 2018-02-13
9880892 System and method for managing semiconductor manufacturing defects Jeanne P. Bickford, Nazmul Habib, Pascal A. Nsame 2018-01-30