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System and method for managing semiconductor manufacturing defects |
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| 10083862 |
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Lawrence A. Clevenger, Kirk D. Peterson, Junli Wang |
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Interconnect structure having tungsten contact copper wiring |
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Contacts having a geometry to reduce resistance |
Lawrence A. Clevenger, Kirk D. Peterson, Terry A. Spooner, Junli Wang |
2018-07-03 |
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Method of optimizing wire RC for device performance and reliability |
Lawrence A. Clevenger, Kirk D. Peterson, John E. Sheets, II, Terry A. Spooner |
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Semiconductor device and method of forming the semiconductor device |
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2018-05-08 |
| 9940430 |
Burn-in power performance optimization |
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Integrated circuit chip reliability qualification using a sample-specific expected fail rate |
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System and method for managing semiconductor manufacturing defects |
Jeanne P. Bickford, Nazmul Habib, Pascal A. Nsame |
2018-01-30 |