Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10103060 | Test structures for dielectric reliability evaluations | David G. Brochu, JR., Baozhen Li, Barry P. Linder, James H. Stathis, Ernest Y. Wu | 2018-10-16 |
RD
Roger A. Dufresne
Overall (2018): #261,503 of 503,207Top 55%
1
Patents 2018