Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10103060 | Test structures for dielectric reliability evaluations | David G. Brochu, JR., Roger A. Dufresne, Baozhen Li, Barry P. Linder, James H. Stathis | 2018-10-16 |
EW
Ernest Y. Wu
Overall (2018): #424,018 of 503,207Top 85%
1
Patents 2018