Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10089161 | System and method for managing semiconductor manufacturing defects | Nazmul Habib, Baozhen Li, Pascal A. Nsame | 2018-10-02 |
| 9891275 | Integrated circuit chip reliability qualification using a sample-specific expected fail rate | Nazmul Habib, Baozhen Li, Tad J. Wilder | 2018-02-13 |
| 9880892 | System and method for managing semiconductor manufacturing defects | Nazmul Habib, Baozhen Li, Pascal A. Nsame | 2018-01-30 |