Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9709905 | System and method for dark field inspection | Bo-Jiun Lin, Hai-Ching Chen, Tien-I Bao | 2017-07-18 |
| 9627206 | Method of double patterning lithography process using plurality of mandrels for integrated circuit applications | Chung-Ju Lee, Shau-Lin Shue, Tien-I Bao, Yung-Hsu Wu | 2017-04-18 |
| 9589890 | Method for interconnect scheme | Carlos H. Diaz, Cheng-Hsiung Tsai, Chung-Ju Lee, Chien-Hua Huang, Hsi-Wen Tien +3 more | 2017-03-07 |