Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9601393 | Selecting one or more parameters for inspection of a wafer | Chris W. Lee, Lisheng Gao, Tao Luo, Kenong Wu, Michael J. Van Riet +1 more | 2017-03-21 |
| 9569834 | Automated image-based process monitoring and control | Himanshu Vajaria, Shabnam Ghadar, Bradley Ries, Mohan Mahadevan, Stilian Ivanov Pandev | 2017-02-14 |