Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9734568 | Automated inline inspection and metrology using shadow-gram images | Himanshu Vajaria, Sina Jahanbin, Mohan Mahadevan | 2017-08-15 |
| 9569834 | Automated image-based process monitoring and control | Himanshu Vajaria, Shabnam Ghadar, Tommaso Torelli, Mohan Mahadevan, Stilian Ivanov Pandev | 2017-02-14 |