| 9846930 |
Detecting defects on a wafer using defect-specific and multi-channel information |
Lisheng Gao, Grace Hsiu-Ling Chen, David W. Shortt |
2017-12-19 |
| 9766186 |
Array mode repeater detection |
Hong Chen, Eugene Shifrin, Masatoshi Yamaoka |
2017-09-19 |
| 9766187 |
Repeater detection |
Hong Chen, Eugene Shifrin, Masatoshi Yamaoka, Gangadharan Sivaraman, Raghav Babulnath +2 more |
2017-09-19 |
| 9727047 |
Defect detection using structural information |
Qing Luo, Hucheng Lee, Lisheng Gao, Eugene Shifrin, Yan Xiong +1 more |
2017-08-08 |
| 9721337 |
Detecting defects on a wafer using defect-specific information |
Meng-Che Wu, Lisheng Gao |
2017-08-01 |
| 9704234 |
Adaptive local threshold and color filtering |
Junqing Huang, Hucheng Lee, Lisheng Gao |
2017-07-11 |
| 9601393 |
Selecting one or more parameters for inspection of a wafer |
Chris W. Lee, Lisheng Gao, Tao Luo, Tommaso Torelli, Michael J. Van Riet +1 more |
2017-03-21 |
| 9552636 |
Detecting defects on a wafer using defect-specific and multi-channel information |
Lisheng Gao, Grace Hsiu-Ling Chen, David W. Shortt |
2017-01-24 |