Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9721337 | Detecting defects on a wafer using defect-specific information | Kenong Wu, Lisheng Gao | 2017-08-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9721337 | Detecting defects on a wafer using defect-specific information | Kenong Wu, Lisheng Gao | 2017-08-01 |