Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9846930 | Detecting defects on a wafer using defect-specific and multi-channel information | Kenong Wu, Lisheng Gao, Grace Hsiu-Ling Chen | 2017-12-19 |
| 9558858 | System and method for imaging a sample with a laser sustained plasma illumination output | Steven R. Lange, Matthew Derstine, Kenneth P. Gross, Wei Zhao, Ilya Bezel +1 more | 2017-01-31 |
| 9552636 | Detecting defects on a wafer using defect-specific and multi-channel information | Kenong Wu, Lisheng Gao, Grace Hsiu-Ling Chen | 2017-01-24 |