Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9601393 | Selecting one or more parameters for inspection of a wafer | Lisheng Gao, Tao Luo, Kenong Wu, Tommaso Torelli, Michael J. Van Riet +1 more | 2017-03-21 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9601393 | Selecting one or more parameters for inspection of a wafer | Lisheng Gao, Tao Luo, Kenong Wu, Tommaso Torelli, Michael J. Van Riet +1 more | 2017-03-21 |