Issued Patents 2017
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9818887 | Back-illuminated sensor with boron layer | Jehn-Huar Chern, Ali R. Ehsani, Gildardo Delgado, David L. Brown, Yung-Ho Alex Chuang | 2017-11-14 |
| 9804101 | System and method for reducing the bandwidth of a laser and an inspection system and method using a laser | Yujun Deng, Yung-Ho Alex Chuang | 2017-10-31 |
| 9766185 | Block-to-block reticle inspection | Abdurrahman Sezginer, Patrick LoPresti, Joe Blecher, Rui-fang Shi, Yalin Xiong | 2017-09-19 |
| 9767986 | Scanning electron microscope and methods of inspecting and reviewing samples | David L. Brown, Yung-Ho Alex Chuang, Marcel Trimpl, Jingjing Zhang, Devis Contarato +1 more | 2017-09-19 |
| 9748294 | Anti-reflection layer for back-illuminated sensor | Masaharu Muramatsu, Hisanori Suzuki, Yasuhito Yoneta, Shinya Otsuka, Jehn-Huar Chem +3 more | 2017-08-29 |
| 9748729 | 183NM laser and inspection system | Yung-Ho Alex Chuang, J. Joseph Armstrong, Yujun Deng, Vladimir Dribinski, Jidong Zhang | 2017-08-29 |
| 9620547 | Image sensor, an inspection system and a method of inspecting an article | Yung-Ho Alex Chuang, Jingjing Zhang | 2017-04-11 |
| 9620341 | Photomultiplier tube, image sensor, and an inspection system using a PMT or image sensor | Yung-Ho Alex Chuang, David L. Brown | 2017-04-11 |
| 9608399 | 193 nm laser and an inspection system using a 193 nm laser | Yung-Ho Alex Chuang, J. Joseph Armstrong, Justin Dianhuan Liou, Vladimir Dribinski | 2017-03-28 |
| 9601299 | Photocathode including silicon substrate with boron layer | Yung-Ho Alex Chuang | 2017-03-21 |
| 9559019 | Metrology through use of feed forward feed sideways and measurement cell re-use | Michael Adel, Leonid Poslavsky, John Ernst Nielsen Madsen, Robert W. Peters | 2017-01-31 |