Issued Patents 2017
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9793673 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, Justin Dianhuan Liou, Vladimir Dribinski, David L. Brown | 2017-10-17 |
| 9768577 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, Justin Dianhuan Liou, Yujun Deng | 2017-09-19 |
| 9753352 | High damage threshold frequency conversion system | — | 2017-09-05 |
| 9748729 | 183NM laser and inspection system | Yung-Ho Alex Chuang, Yujun Deng, Vladimir Dribinski, John Fielden, Jidong Zhang | 2017-08-29 |
| 9608399 | 193 nm laser and an inspection system using a 193 nm laser | Yung-Ho Alex Chuang, Justin Dianhuan Liou, Vladimir Dribinski, John Fielden | 2017-03-28 |