Issued Patents 2017
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9778207 | Integrated multi-pass inspection | Weston L. Sousa, Yalin Xiong | 2017-10-03 |
| 9766185 | Block-to-block reticle inspection | Abdurrahman Sezginer, Patrick LoPresti, Joe Blecher, Yalin Xiong, John Fielden | 2017-09-19 |
| 9733640 | Method and apparatus for database-assisted requalification reticle inspection | Lih-Huah Yiin, Venkatraman Iyer | 2017-08-15 |
| 9612541 | Qualifying patterns for microlithography | Mark Wagner | 2017-04-04 |
| 9607371 | Mesoscopic defect detection for reticle inspection | Zhian Guo, Bing Li | 2017-03-28 |
| 9574227 | Method for detecting variation of gene for non-diagnostic purpose based on fluorescence quenching and probe thereof | Bochun Huang | 2017-02-21 |
| 9547892 | Apparatus and methods for predicting wafer-level defect printability | Abdurrahman Sezginer | 2017-01-17 |